Digital and Mixed Signal Testing Technology The Standards IEEE 1149.1 and IEEE 1149.4
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International Journal of Computer & Organization Trends (IJCOT) |  |
| © 2011 by IJCOT Journal | ||
| Volume-1 Issue-3 |
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| Year of Publication : 2011 | ||
| Authors : Partha Garai, Chaitali Biswas Dutta |
Citation
Partha Garai, Chaitali Biswas Dutta. "Digital and Mixed Signal Testing Technology The Standards IEEE 1149.1 and IEEE 1149.4". International Journal of Computer & organization Trends (IJCOT), V1(3):40-44 Nov - Dec 2011, ISSN 2249-2593, www.ijcotjournal.org. Published by Seventh Sense Research Group.
Abstract
Among all the On - Chip built - in self - test (BIST) technologies, JTAG is the most well - known and widely used . In th is paper, the mechanism of basic JTAG (IEEE 1149.1) has been discussed . The pitfalls of the method are also discussed, some of which are rectified in the future standard, IEEE 1149.4 for Mixed Signal testing, which is also described here . Many of the valua ble research papers on the se standards are analyzed .
References
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Keywords
EEE 1149.1, IEEE 1149.4, JTAG, Boundary Scan, BSDL, Mixed Signal, SoC.